An internal processing capability is added to a computer memory by adding a small processor, a small amount of processor RAM memory, a small amount of non-volatile memory, and some logic. During wafer testing the internal processor system allows the memory to be tested at full speed and substantially simultaneously with the testing of other memories on the wafer. At any stage after packaging, the part can be tested by having the host processor read the non-volatile memory, determine what test program to use, load it into the RAM memory, and run the Self-Test program. The internal processor system also allows additional functions such as data searching, data moving, and graphics primitives to be performed entirely within the memory.